Low Temperature – Atomic Force Microscope/ Magnetic Force Microscope (LT-AFM/MFM) Ultrastable Low Temperature Atomic Force Microscope/ Magnetic Force Microscope(LT-AFM/MFM) Head Alignment free cantilever design for ease of use Extremely Low Noise Fiber Interferometer operating at 1310nm, ~15fm/√Hz noise level 100×100μm XY Scan area @ 300K & 16×16μm XY Scan area @ 4K (up to 30×30 XY Scan area @ 4K is available as well as smaller sizes for higher precision) 7.2μm Z-Scan range @ 300K & 2.4μm Z-Scan range@ 4K (typical) Magnetic Force Microscope with better than 10nm resolution (demonstrated with 394Gbpsi Seagate Hard disk, cantilever depended) Atomic Force Microscope (Contact, & dynamic modes) Ready for Conductive Atomic Force Microscopy (c-AFM) option (to be purchased separately) Ready for Kelvin Probe Force Microcopy (KPFM) option (to be purchased separately) Ready for Piezo Response Force Microscopy (PRFM) option(to be purchased separately) Sample position Coarse range, 3 mm in XY and 10mm in Z

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