Dynamic Image Analysis (DIA) Systems from HAVER provide particle analyses with standardised units and customised inline and online solutions for the largest abstract measuring range from 10 micron up to 400 mm. All particles of a sample which lie within the measuring range are analysed and counted in real time due to the approved line scan camera. The Computerized Particle Analysis for particle size and particle shape analysis of dry and non-agglomerating bulk material.
Model No.: |
|
Brand Name : |
HAVER Particle Analysis |
Used in : |
Engineering Industry, Scientific Research, |
Place of Origin : |
Germany |
Product Standard : |
ISO, |
Min Quantity : |
1 |
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