This microscope family is used to measure various surface properties of materials and widely used in science and technology applications. They are complementary to the traditional optical and electron microscopes and have extensive applications beyond simple surface topography measurements. Properties like carrier density, charge distribution, binding energy, electrochemical properties, surface magnetic field profile, hardness and spectroscopic measurements from simple IV to force distance and nano mechanical properties can be studied with these microscopes. It is also possible to inspect samples under various atmospheric conditions, especially needed for biological applications. Our products classified in this category are ezAFM, ezSTM, hpAFM, AFM+, Ambient AFM and RT-SHPM. ezAFM, Alignment Free Design 120 x 120 x 40μm or 40 x 40 x 4μm (XYZ) Z Resolution <0.2nm with 120μmx120μm scanner Z Resolution <0.02nm with 40μmx40μm scanner<75 fm√Hz noise floor Lateral Resolution with large scanner <16nm, with smallscanner <5nm Unlimited Sample Size ezAFM Modes AC Modes: Dynamic Mode MFM (Magnetic force microscopy) DC Modes: Contact mode Lateral force microscopy Liquid Cell for ezAFM (ezAFM-Aqua)

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